The Horiba Omegascope platform enables fast and accurate surface investigation across a wide range of samples, thanks to an automated and motorized laser–cantilever–photodiode alignment system that makes it unique in its class. The use of a 1300 nm laser eliminates any risk of interference, making it ideal for both biological samples and photovoltaic applications. The scanning probe microscope provides high-resolution topographic images, allowing detailed analysis of roughness and grain size; with dedicated probes, it can also reveal the electrical properties and work function fluctuations of the sample at the nanometric scale. The closed-loop scanner, with a wide scanning range of 100 × 100 × 15 µm, ensures highly stable and precise measurements over large areas, delivering true molecular-resolution images with fast response, minimal drift, and reliable metrological traceability.
What truly sets the Horiba Omegascope apart is its native readiness for Raman integration: in addition to operating as a stand-alone system with advanced performance, it is designed for direct coupling with a Raman spectrometer. Optical access from both the top and the side of the tip–sample region (with objectives up to 0.7 NA) enables confocal detection of optical signals and precise focusing of the Raman laser source onto the tip, an essential condition for TERS (Tip-Enhanced Raman Spectroscopy) characterization. The Raman laser beam is intercepted and reflected by a dedicated mirror-based optical system and then precisely focused onto the SPM tip. This architecture ensures an optimized and immediate integration of the two techniques, without the need for modifications or retrofits.
The two objectives used to focus the laser not only guarantee excellent performance in TERS mode but also prove highly valuable in stand-alone SPM analyses. The ability to observe the sample surface simultaneously from both top and side perspectives provides complete visual control of the ongoing analysis, allowing accurate selection of the scanning area and significantly reducing the risk of accidental tip damage due to asperities or impurities on the sample surface.
What truly sets the Horiba Omegascope apart is its native readiness for Raman integration: in addition to operating as a stand-alone system with advanced performance, it is designed for direct coupling with a Raman spectrometer. Optical access from both the top and the side of the tip–sample region (with objectives up to 0.7 NA) enables confocal detection of optical signals and precise focusing of the Raman laser source onto the tip, an essential condition for TERS (Tip-Enhanced Raman Spectroscopy) characterization. The Raman laser beam is intercepted and reflected by a dedicated mirror-based optical system and then precisely focused onto the SPM tip. This architecture ensures an optimized and immediate integration of the two techniques, without the need for modifications or retrofits.
The two objectives used to focus the laser not only guarantee excellent performance in TERS mode but also prove highly valuable in stand-alone SPM analyses. The ability to observe the sample surface simultaneously from both top and side perspectives provides complete visual control of the ongoing analysis, allowing accurate selection of the scanning area and significantly reducing the risk of accidental tip damage due to asperities or impurities on the sample surface.
TECHNICAL SPECIFICATION
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Sample scanning range: < 100 µm x 100 µm x 15 µm (±10 %);
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3 Digital closed loop control for X, Y, Z axes;
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Motorized Z approach range 18 mm;
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Maximum Image (Data) Resolution: 5000x5000 pixels;
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Maximum scanning area: 100 x 100 µm;
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Lateral resolution: 1 nm;
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Vertical resolution: 0.1 nm.
AVAILABLE TECHNIQUES
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AFM
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Phase signal imaging
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Conductive AFM
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KPFM
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Local I(V)
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TERS
SAMPLES
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Substrates:
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Maximum Sample Size: 15 x 15mm
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Maximum Sample Heights: 15 mm
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USE FOR
- wide bandgap semiconductors;
- III-V semiconductors;
- refractory metals;
- photovoltaic cells;
- hybrid thermionic-photovoltaic systems;
- photon-enhanced thermionic emission systems.
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